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標題Title: The Effect of Ion Mobility on PEOS
作者Authors: 鍾慎修,Max Chung..等
上傳單位Department: 電子工程系
上傳時間Date: 2010-6-18
上傳者Author: 鍾慎修
審核單位Department: 電子工程系
審核老師Teacher: 鍾慎修
檔案類型Categories: 論文Thesis
關鍵詞Keyword: Plasma Erosion Opening Switch,PEOS
摘要Abstract: Plasma Erosion Opening Switch (PEOS) bas been developed in the past mainly for diverting TW power to produce pulsed ion beams for fusion research. It has demonstrated the highest current rise time possible and
highest energy delivered. Recent advancements in high power microwave generate new interest in applying PEOS in such systems. Traditional carbon flash board plasma source is not suitable for repetitive application. We suggest the use of electrostatic injected hydrogen plasma as a new plasma source for a repeatable PEOS. Carbon plasma and hydrogen plasma differ in the areas like plasma injection speed, sheath current density, opening mechanism, and space charge field. Our simulations indicate the most importance factors in PEOS are magnetic insulation and
cathode surface emission; therefore replacing carbon with hydrogen should make similar performance. Some discrepancies between simuIation and experimental work are discussed and concept drawings on how to test the
simulation experimentally and how to apply hydrogen are suggested.

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2010_6_011c94a5.pdf 904Kb pdf 236 47
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