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標題Title: A Wavelet-based Detection Method for Mechanical Defects in Manufacturing System
作者Authors: 沈毓泰
上傳單位Department: 機械工程系
上傳時間Date: 2009-11-12
上傳者Author: 沈毓泰
審核單位Department: 機械工程系
審核老師Teacher: 沈毓泰
檔案類型Categories: 論文Thesis
關鍵詞Keyword: Wavelet, Envelope transform, Defect detection
摘要Abstract: In this paper, a wavelet-based detection method is proposed to apply in the defect detection of manufacturing system. In the method, a wavelet-based transformation function is constructed by a complex exponential function where the imaginary part is the Hilbert transform of its own real part. From the numerical implementation and the experiment study, it is found that the transformation function has the satisfactory properties of both fast convergence waveform and good passband quality by properly setting these parameters. Thus, it could be adopted in the real-time signal processing.

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2009_11_aa090bb1.doc 78Kb doc 616 91
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